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 GT25Q301
TOSHIBA Insulated Gate Bipolar Transistor Silicon N Channel IGBT
GT25Q301
High Power Switching Applications Motor Control Applications
* * * * * The 3rd generation Enhancement-mode High speed: tf = 0.32 s (max) Low saturation voltage: VCE (sat) = 2.7 V (max) FRD included between emitter and collector Unit: mm
Maximum Ratings (Ta = 25C)
Characteristics Collector-emitter voltage Gate-emitter voltage Collector current DC 1 ms DC 1 ms Symbol VCES VGES IC ICP IF IFP PC Tj Tstg Rating 1200 20 25 50 25 50 200 150 -55 to 150 Unit V V A
Diode forward current
A
JEDEC JEITA
2-21F2C
Collector power dissipation (Tc = 25C) Junction temperature Storage temperature range
W C C
TOSHIBA
Weight: 9.75 g (typ.)
Equivalent Circuit
Collector
Gate Emitter
1
2003-01-28
GT25Q301
Electrical Characteristics (Ta = 25C)
Characteristics Gate leakage current Collector cut-off current Gate-emitter cut-off voltage Collector-emitter saturation voltage Input capacitance Rise time Turn-on time Switching time Fall time Turn-off time Diode forward voltage Reverse recovery time Thermal resistance (IGBT) Thermal resistance (diode) tf toff VF trr Rth (j-c) Rth (j-c) IF = 25 A, VGE = 0 IF = 25 A, di/dt = -200 A/s Symbol IGES ICES VGE (OFF) VCE (sat) Cies tr ton Inductive load VCC = 600 V, IC = 25 A VGG = 15 V, RG = 43 (Note) 0.16 0.68 0.32 3.0 350 0.625 1.38 V ns C/W C/W Test Condition VGE = 20 V, VCE = 0 VCE = 1200 V, VGE = 0 IC = 2.5 mA, VCE = 5 V IC = 25 A, VGE = 15 V VCE = 50 V, VGE = 0, f = 1 MHz Min 4.0 Typ. 2.1 1360 0.10 0.30 Max 500 1.0 7.0 2.7 s Unit nA mA V V pF
Note: Switching time measurement circuit and input/output waveforms
VGE RG VCC -VGE IC RG L 0
90% 10%
IC 90% 90% 10% td (on) tf toff ton tr 10%
VCE 0
VCE
10% td (off)
10%
2
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GT25Q301
IC - VCE
50 20 Common emitter Tc = 25C 40 Common emitter
VCE - VGE
(V)
Tc = -40C 16
(A)
IC
Collector-emitter voltage
20 30
15
VCE
20 10 10
12
Collector current
8 IC = 10 A 4 25 50
VGE = 9 V
0
0
1
2
3
4
5
0 0
4
8
12
16
20
Collector-emitter voltage
VCE
(V)
Gate-emitter voltage VGE
(V)
VCE - VGE
20 Common emitter 20 Common emitter Tc = 25C 16
VCE - VGE
(V)
(V)
Tc = 125C 16
VCE
Collector-emitter voltage
Collector-emitter voltage
VCE
12 8 50 4 IC = 10 A 25
12
8 50 4 IC = 10 A 25
0
0
4
8
12
16
20
0 0
4
8
12
16
20
Gate-emitter voltage VGE
(V)
Gate-emitter voltage VGE
(V)
IC - VGE
50 Common emitter 40 4
VCE (sat) - Tc
Collector-emitter saturation voltage VCE (sat) (V)
VCE = 5 V
50 3 25
IC
30
Collector current
(A)
2
IC = 10 A
20
25
1 Common emitter VGE = 15 V
10
Tc = 125C
-40
0 0
4
8
12
16
20
0 -60
-20
20
60
100
140
Gate-emitter voltage VGE
(V)
Case temperature Tc
(C)
3
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GT25Q301
Switching Time ton, tr - RG
3 Common emitter VCC = 600 V VGG = 15 V IC = 25 A : Tc = 25C : Tc = 125C 1
Switching Time ton, tr - IC
(s)
1
(s)
ton
ton 0.3
ton, tr
0.5 0.3
Switching time
ton, tr
0.1
Switching time
tr Common emitter VCC = 600 V VGG = 15 V RG = 43 : Tc = 25C : Tc = 125C 0 5 10 15 20 25 30
tr 0.1
0.03
0.05 3
5
10
30
50
100
300
500 0.01
Gate resistance RG
()
Collector current
IC
(A)
Switching Time toff, tf - RG
3 Common emitter VCC = 600 V VGG = 15 V IC = 25 A : Tc = 25C 1 : Tc = 125C 0.5 0.3 tf 0.1 1 toff
Switching Time toff, tf - IC
toff
(s)
(s)
toff, tf
0.3 tf 0.1 Common emitter VCC = 600 V VGG = 15 V RG =43 : Tc = 25C : Tc = 125C 0 5 10 15 20 25 30
Switching time
Switching time
500
toff, tf
0.03 5 10 30 50 100 300
0.05 3
Gate resistance RG
()
0.01
Collector current
IC
(A)
Switching Loss Eon, Eoff - IC Switching Loss Eon, Eoff - RG
30 Common emitter VCC = 600 V VGG = 15 V IC = 25 A 10 : Tc = 25C : Tc = 125C 5 3 Eoff 10
(mJ)
(mJ)
3
Eon
Eon, Eoff
Eon
Eon, Eoff
1
Eoff
Switching loss
Switching loss
0.3
1
0.5 3
5
10
30
50
100
300
500
0.1
Common emitter VCC = 600 V VGG = 15 V RG = 43 : Tc = 25C : Tc = 125C 0 5 10 15 20 25 30
Gate resistance RG
()
Collector current
IC
(A)
4
2003-01-28
GT25Q301
C - VCE
1000
VCE, VGE - QG
Common emitter RL = 12 Tc = 25C 400 600 600 12 20
(V)
10000
800
16
(pF)
Cies
Capacitance C
1000
300 100 Common emitter VGE = 0 f = 1 MHz Tc = 25C 0.3 1 3 10 30 100 Coes Cres
400
VCE = 200 V
8
30 10 0.1
200
4
300
1000
0 0
40
80
120
160
0 200
Collector-emitter voltage VCE
(V)
Gate charge
QG
(nC)
IF - VF
50 Common emitter VGE = 0 40 -40 100
trr, Irr - IF
1000
(A)
(A)
Reverse recovery current Irr
25 30
Forward current IF
10
Irr
100
20
3
10
Tc = 125C
Common emitter di/dt = -200 A/s VGE = 0 : Tc = 25C : Tc = 125C 5 10 15 20 25 10 30
0 0
1
2
3
4
5
1 0
Forward voltage
VF
(V)
Forward current
IF
(A)
Safe Operating Area
100 50 30 IC max (pulsed)* IC max (continuous) 100 s* 50 s* 100 50 30
Reverse Bias SOA
(A)
IC
Collector current
3 *: Single nonrepetitive pulse Tc = 25C Curves must be derated linearly with increase in temperature. 3 10 30 100 10 ms*
Collector current
5
DC operation
1 ms*
IC
10
(A)
10 5 3
1 0.5 0.3
1 0.5 0.3 Tj 125C VGE = 15 V RG = 43
0.1 1
300
1000
3000
0.1 1
3
10
30
100
300
1000
3000
Collector-emitter voltage VCE
(V)
Collector-emitter voltage VCE
(V)
5
2003-01-28
Reverse recovery time
trr
trr
30
(ns)
Gate-emitter voltage VGE
3000
Collector-emitter voltage VCE
(V)
GT25Q301
rth (t) - tw
102 Tc = 25C 101 Diode stage 100 IGBT stage 10-1 10-2 10-3
Transient thermal impedance rth (t) (C/W)
10-4 -5 10
10-4
10-3
10-2
10-1
100
101
102
Pulse width
tw
(s)
6
2003-01-28
GT25Q301
RESTRICTIONS ON PRODUCT USE
000707EAA
* TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice.
7
2003-01-28


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